1 /* SPDX-License-Identifier: GPL-2.0+ */
2 /*
3  *  linux/include/linux/mtd/bbm.h
4  *
5  *  NAND family Bad Block Management (BBM) header file
6  *    - Bad Block Table (BBT) implementation
7  *
8  *  Copyright © 2005 Samsung Electronics
9  *  Kyungmin Park <kyungmin.park@samsung.com>
10  *
11  *  Copyright © 2000-2005
12  *  Thomas Gleixner <tglx@linuxtronix.de>
13  *
14  */
15 #ifndef __LINUX_MTD_BBM_H
16 #define __LINUX_MTD_BBM_H
17 
18 /* The maximum number of NAND chips in an array */
19 #ifndef CONFIG_SYS_NAND_MAX_CHIPS
20 #define CONFIG_SYS_NAND_MAX_CHIPS	1
21 #endif
22 
23 /**
24  * struct nand_bbt_descr - bad block table descriptor
25  * @options:	options for this descriptor
26  * @pages:	the page(s) where we find the bbt, used with option BBT_ABSPAGE
27  *		when bbt is searched, then we store the found bbts pages here.
28  *		Its an array and supports up to 8 chips now
29  * @offs:	offset of the pattern in the oob area of the page
30  * @veroffs:	offset of the bbt version counter in the oob are of the page
31  * @version:	version read from the bbt page during scan
32  * @len:	length of the pattern, if 0 no pattern check is performed
33  * @maxblocks:	maximum number of blocks to search for a bbt. This number of
34  *		blocks is reserved at the end of the device where the tables are
35  *		written.
36  * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
37  *              bad) block in the stored bbt
38  * @pattern:	pattern to identify bad block table or factory marked good /
39  *		bad blocks, can be NULL, if len = 0
40  *
41  * Descriptor for the bad block table marker and the descriptor for the
42  * pattern which identifies good and bad blocks. The assumption is made
43  * that the pattern and the version count are always located in the oob area
44  * of the first block.
45  */
46 struct nand_bbt_descr {
47 	int options;
48 	int pages[CONFIG_SYS_NAND_MAX_CHIPS];
49 	int offs;
50 	int veroffs;
51 	uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS];
52 	int len;
53 	int maxblocks;
54 	int reserved_block_code;
55 	uint8_t *pattern;
56 };
57 
58 /* Options for the bad block table descriptors */
59 
60 /* The number of bits used per block in the bbt on the device */
61 #define NAND_BBT_NRBITS_MSK	0x0000000F
62 #define NAND_BBT_1BIT		0x00000001
63 #define NAND_BBT_2BIT		0x00000002
64 #define NAND_BBT_4BIT		0x00000004
65 #define NAND_BBT_8BIT		0x00000008
66 /* The bad block table is in the last good block of the device */
67 #define NAND_BBT_LASTBLOCK	0x00000010
68 /* The bbt is at the given page, else we must scan for the bbt */
69 #define NAND_BBT_ABSPAGE	0x00000020
70 /* bbt is stored per chip on multichip devices */
71 #define NAND_BBT_PERCHIP	0x00000080
72 /* bbt has a version counter at offset veroffs */
73 #define NAND_BBT_VERSION	0x00000100
74 /* Create a bbt if none exists */
75 #define NAND_BBT_CREATE		0x00000200
76 /*
77  * Create an empty BBT with no vendor information. Vendor's information may be
78  * unavailable, for example, if the NAND controller has a different data and OOB
79  * layout or if this information is already purged. Must be used in conjunction
80  * with NAND_BBT_CREATE.
81  */
82 #define NAND_BBT_CREATE_EMPTY	0x00000400
83 /* Write bbt if neccecary */
84 #define NAND_BBT_WRITE		0x00002000
85 /* Read and write back block contents when writing bbt */
86 #define NAND_BBT_SAVECONTENT	0x00004000
87 /* Search good / bad pattern on the first and the second page */
88 #define NAND_BBT_SCAN2NDPAGE	0x00008000
89 /* Search good / bad pattern on the last page of the eraseblock */
90 #define NAND_BBT_SCANLASTPAGE	0x00010000
91 /*
92  * Use a flash based bad block table. By default, OOB identifier is saved in
93  * OOB area. This option is passed to the default bad block table function.
94  */
95 #define NAND_BBT_USE_FLASH	0x00020000
96 /*
97  * Do not store flash based bad block table marker in the OOB area; store it
98  * in-band.
99  */
100 #define NAND_BBT_NO_OOB		0x00040000
101 /*
102  * Do not write new bad block markers to OOB; useful, e.g., when ECC covers
103  * entire spare area. Must be used with NAND_BBT_USE_FLASH.
104  */
105 #define NAND_BBT_NO_OOB_BBM	0x00080000
106 
107 /*
108  * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr
109  * was allocated dynamicaly and must be freed in nand_release(). Has no meaning
110  * in nand_chip.bbt_options.
111  */
112 #define NAND_BBT_DYNAMICSTRUCT	0x80000000
113 
114 /* The maximum number of blocks to scan for a bbt */
115 #define NAND_BBT_SCAN_MAXBLOCKS	4
116 
117 /*
118  * Constants for oob configuration
119  */
120 #define NAND_SMALL_BADBLOCK_POS		5
121 #define NAND_LARGE_BADBLOCK_POS		0
122 #define ONENAND_BADBLOCK_POS		0
123 
124 /*
125  * Bad block scanning errors
126  */
127 #define ONENAND_BBT_READ_ERROR		1
128 #define ONENAND_BBT_READ_ECC_ERROR	2
129 #define ONENAND_BBT_READ_FATAL_ERROR	4
130 
131 /**
132  * struct bbm_info - [GENERIC] Bad Block Table data structure
133  * @bbt_erase_shift:	[INTERN] number of address bits in a bbt entry
134  * @badblockpos:	[INTERN] position of the bad block marker in the oob area
135  * @options:		options for this descriptor
136  * @bbt:		[INTERN] bad block table pointer
137  * @isbad_bbt:		function to determine if a block is bad
138  * @badblock_pattern:	[REPLACEABLE] bad block scan pattern used for
139  *			initial bad block scan
140  * @priv:		[OPTIONAL] pointer to private bbm date
141  */
142 struct bbm_info {
143 	int bbt_erase_shift;
144 	int badblockpos;
145 	int options;
146 
147 	uint8_t *bbt;
148 
149 	int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
150 
151 	/* TODO Add more NAND specific fileds */
152 	struct nand_bbt_descr *badblock_pattern;
153 
154 	void *priv;
155 };
156 
157 /* OneNAND BBT interface */
158 extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
159 extern int onenand_default_bbt(struct mtd_info *mtd);
160 
161 #endif	/* __LINUX_MTD_BBM_H */
162